@inbook{f751740d8b70494c9a33dd6189e20680,
title = "Growth studies of heteroepitaxial oxide thin films using reflection high-energy electron diffraction (RHEED)",
abstract = "In this chapter, reflection high-energy electron diffraction (RHEED) in combination with pulsed laser deposition (PLD) is described. Both the use of RHEED as a real-time rate-monitoring technique and methods to study nucleation and growth during PLD are discussed. After a brief introduction of RHEED, a case is made for the step density model to describe the intensity variations encountered during deposition. An overview of these intensity variations, the intensity response during an RHEED experiment as a result of various kinetic growth modes, is given",
keywords = "2024 OA procedure",
author = "Gertjan Koster and Mark Huijben and A. Janssen and Rijnders, {Augustinus J.H.M.}",
year = "2015",
doi = "10.1016/B978-1-78242-245-7.00001-4",
language = "English",
isbn = "978-1-78242-245-7",
series = "Woodhead Publishing Series in Electronic and Optical Materials",
publisher = "Woodhead Publishing",
pages = "3--29",
editor = "G. Koster and M. Huijben and A.J.H.M. Rijnders",
booktitle = "Epitaxial Growth of Complex Metal Oxides",
}