TY - JOUR
T1 - Guest Editorial: IEEE Transactions on Emerging Topics in Computing Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era
AU - Natale, Giorgio Di
AU - Ottavi, Marco
PY - 2018/4/1
Y1 - 2018/4/1
N2 - The ten papers in this special section address issues related to the design, reliability, security and testing of integrated systems in the nanoscale era. These papers cover a wide spectrum of techniques, including the issues of low-power design, the test, the reliability, the security and trust of circuits manufactured with emerging technologies.
AB - The ten papers in this special section address issues related to the design, reliability, security and testing of integrated systems in the nanoscale era. These papers cover a wide spectrum of techniques, including the issues of low-power design, the test, the reliability, the security and trust of circuits manufactured with emerging technologies.
UR - https://doi.org/10.1109/TETC.2018.2802788
U2 - 10.1109/TETC.2018.2802788
DO - 10.1109/TETC.2018.2802788
M3 - Article
SN - 2168-6750
VL - 6
SP - 170
EP - 171
JO - IEEE Transactions on Emerging Topics in Computing
JF - IEEE Transactions on Emerging Topics in Computing
IS - 2
ER -