Hand-Geometry Recognition Based on Contour Parameters

Raymond N.J. Veldhuis, A.M. Bazen, W.D.T. Booij, A.J. Hendrikse

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    14 Citations (Scopus)


    This paper demonstrates the feasibility of a new method of hand-geometry recognition based on parameters derived from the contour of the hand. The contour is completely determined by the black-and-white image of the hand and can be derived from it by means of simple image-processing techniques. It can be modelled by parameters, or features, that can capture more details of the shape of the hand than what is possible with the standard geometrical features used in hand-geometry recognition. The set of features considered in this paper consists of the spatial coordinates of certain landmarks on the contour. The feature set and the recognition method used are discussed in detail. The usefulness of the proposed feature set is evaluated experimentally in a verification context. The verification performance obtained with contour-based features is compared with the verification performance of other methods described in the literature.
    Original languageUndefined
    Title of host publicationSPIE Biometric Technology for Human Identification II
    EditorsA.K. Jain, N.K. Ratha
    Place of PublicationWashington
    Number of pages10
    ISBN (Print)0-8194-5764-7
    Publication statusPublished - Mar 2005
    EventSPIE Biometric Technology for Human Identification II, Orlando, FL, USA: SPIE Biometric Technology for Human Identification II - Washington
    Duration: 1 Mar 2005 → …


    ConferenceSPIE Biometric Technology for Human Identification II, Orlando, FL, USA
    Period1/03/05 → …


    • EWI-711
    • METIS-248071
    • SCS-Safety

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