Hand-Geometry Recognition Based on Contour Parameters

Raymond N.J. Veldhuis, A.M. Bazen, W.D.T. Booij, A.J. Hendrikse

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    13 Citations (Scopus)

    Abstract

    This paper demonstrates the feasibility of a new method of hand-geometry recognition based on parameters derived from the contour of the hand. The contour is completely determined by the black-and-white image of the hand and can be derived from it by means of simple image-processing techniques. It can be modelled by parameters, or features, that can capture more details of the shape of the hand than what is possible with the standard geometrical features used in hand-geometry recognition. The set of features considered in this paper consists of the spatial coordinates of certain landmarks on the contour. The feature set and the recognition method used are discussed in detail. The usefulness of the proposed feature set is evaluated experimentally in a verification context. The verification performance obtained with contour-based features is compared with the verification performance of other methods described in the literature.
    Original languageUndefined
    Title of host publicationSPIE Biometric Technology for Human Identification II
    EditorsA.K. Jain, N.K. Ratha
    Place of PublicationWashington
    PublisherSPIE - The International Society for Optical Engineering
    Pages344-353
    Number of pages10
    ISBN (Print)0-8194-5764-7
    DOIs
    Publication statusPublished - Mar 2005

    Keywords

    • EWI-711
    • METIS-248071
    • SCS-Safety

    Cite this

    Veldhuis, R. N. J., Bazen, A. M., Booij, W. D. T., & Hendrikse, A. J. (2005). Hand-Geometry Recognition Based on Contour Parameters. In A. K. Jain, & N. K. Ratha (Eds.), SPIE Biometric Technology for Human Identification II (pp. 344-353). Washington: SPIE - The International Society for Optical Engineering. https://doi.org/10.1117/12.602683
    Veldhuis, Raymond N.J. ; Bazen, A.M. ; Booij, W.D.T. ; Hendrikse, A.J. / Hand-Geometry Recognition Based on Contour Parameters. SPIE Biometric Technology for Human Identification II. editor / A.K. Jain ; N.K. Ratha. Washington : SPIE - The International Society for Optical Engineering, 2005. pp. 344-353
    @inproceedings{d06677bac30d4b57992af8851f64c77b,
    title = "Hand-Geometry Recognition Based on Contour Parameters",
    abstract = "This paper demonstrates the feasibility of a new method of hand-geometry recognition based on parameters derived from the contour of the hand. The contour is completely determined by the black-and-white image of the hand and can be derived from it by means of simple image-processing techniques. It can be modelled by parameters, or features, that can capture more details of the shape of the hand than what is possible with the standard geometrical features used in hand-geometry recognition. The set of features considered in this paper consists of the spatial coordinates of certain landmarks on the contour. The feature set and the recognition method used are discussed in detail. The usefulness of the proposed feature set is evaluated experimentally in a verification context. The verification performance obtained with contour-based features is compared with the verification performance of other methods described in the literature.",
    keywords = "EWI-711, METIS-248071, SCS-Safety",
    author = "Veldhuis, {Raymond N.J.} and A.M. Bazen and W.D.T. Booij and A.J. Hendrikse",
    note = "Imported from DIES",
    year = "2005",
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    Veldhuis, RNJ, Bazen, AM, Booij, WDT & Hendrikse, AJ 2005, Hand-Geometry Recognition Based on Contour Parameters. in AK Jain & NK Ratha (eds), SPIE Biometric Technology for Human Identification II. SPIE - The International Society for Optical Engineering, Washington, pp. 344-353. https://doi.org/10.1117/12.602683

    Hand-Geometry Recognition Based on Contour Parameters. / Veldhuis, Raymond N.J.; Bazen, A.M.; Booij, W.D.T.; Hendrikse, A.J.

    SPIE Biometric Technology for Human Identification II. ed. / A.K. Jain; N.K. Ratha. Washington : SPIE - The International Society for Optical Engineering, 2005. p. 344-353.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Hand-Geometry Recognition Based on Contour Parameters

    AU - Veldhuis, Raymond N.J.

    AU - Bazen, A.M.

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    AU - Hendrikse, A.J.

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    N2 - This paper demonstrates the feasibility of a new method of hand-geometry recognition based on parameters derived from the contour of the hand. The contour is completely determined by the black-and-white image of the hand and can be derived from it by means of simple image-processing techniques. It can be modelled by parameters, or features, that can capture more details of the shape of the hand than what is possible with the standard geometrical features used in hand-geometry recognition. The set of features considered in this paper consists of the spatial coordinates of certain landmarks on the contour. The feature set and the recognition method used are discussed in detail. The usefulness of the proposed feature set is evaluated experimentally in a verification context. The verification performance obtained with contour-based features is compared with the verification performance of other methods described in the literature.

    AB - This paper demonstrates the feasibility of a new method of hand-geometry recognition based on parameters derived from the contour of the hand. The contour is completely determined by the black-and-white image of the hand and can be derived from it by means of simple image-processing techniques. It can be modelled by parameters, or features, that can capture more details of the shape of the hand than what is possible with the standard geometrical features used in hand-geometry recognition. The set of features considered in this paper consists of the spatial coordinates of certain landmarks on the contour. The feature set and the recognition method used are discussed in detail. The usefulness of the proposed feature set is evaluated experimentally in a verification context. The verification performance obtained with contour-based features is compared with the verification performance of other methods described in the literature.

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    Veldhuis RNJ, Bazen AM, Booij WDT, Hendrikse AJ. Hand-Geometry Recognition Based on Contour Parameters. In Jain AK, Ratha NK, editors, SPIE Biometric Technology for Human Identification II. Washington: SPIE - The International Society for Optical Engineering. 2005. p. 344-353 https://doi.org/10.1117/12.602683