Height Anomalies in Tapping Mode Atomic Force Microscopy

S.J.T. van Noort, O.H. Willemsen, Kees van der Werf, B.G. de Grooth

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationMunster
    Publication statusPublished - 7 Oct 1996

    Keywords

    • METIS-131606

    Cite this

    van Noort, S. J. T., Willemsen, O. H., van der Werf, K., & de Grooth, B. G. (1996, Oct 7). Height Anomalies in Tapping Mode Atomic Force Microscopy. Munster.