Height drift correction in non-raster atomic force microscopy

Travis R. Meyer, Dominik Ziegler, Christoph Brune, Alex Chen, Rodrigo Farnham, Nen Huynh, Jen-Mei Chang, Andrea L. Bertozzi, Paul D. Ashby

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    16 Citations (Scopus)
    17 Downloads (Pure)

    Abstract

    We propose a novel method to detect and correct drift in non-raster scanning probe microscopy. In conventional raster scanning drift is usually corrected by subtracting a fitted polynomial from each scan line, but sample tilt or large topographic features can result in severe artifacts. Our method uses self-intersecting scan paths to distinguish drift from topographic features. Observing the height differences when passing the same position at different times enables the reconstruction of a continuous function of drift. We show that a small number of self-intersections is adequate for automatic and reliable drift correction. Additionally, we introduce a fitness function which provides a quantitative measure of drift correctability for any arbitrary scan shape.
    Original languageUndefined
    Pages (from-to)48-54
    Number of pages7
    JournalUltramicroscopy
    Volume137
    DOIs
    Publication statusPublished - Feb 2014

    Keywords

    • EWI-25596
    • Atomic Force Microscopy
    • Drift correction
    • Mathematical imaging
    • Non-raster scan
    • METIS-309828
    • IR-93779
    • Self-intersecting scan

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