Heterogeneous oxidation of Si(111) 7 x 7 monitored with Kelvin Probe Force Microscopy

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Abstract

Laterally resolved topography and Contact Potential Difference (CPD) images, acquired during the exposure of clean Si(1 1 1) 7 × 7 to molecular oxygen at room temperature, show a heterogeneous oxidation process, without preference for step edges. The increase of and lateral changes in work function variations show that the CPD variations of the final oxide film are related to the silicon/oxide interface. The molecular Höfer precursor has a pronounced influence on the development of the interface bonding
Original languageUndefined
Pages (from-to)4598-4602
Number of pages5
JournalSurface science
Volume601
Issue number19
DOIs
Publication statusPublished - 2007

Keywords

  • METIS-242118
  • IR-74897

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