Hierarchical modeling of automotive sensor front-ends for structural diagnosis of aging faults

Hans G. Kerkhoff, J. Wan, Yong Zhao

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    3 Citations (Scopus)
    31 Downloads (Pure)


    The semiconductor industry for automotive applications is growing rapidly. This is because advanced electronics is now being developed to monitor and control many vital functions previously handled purely mechanical. In addition hybrid and pure electrical cars are emerging. Parts of these electronic systems have strict safety-critical requirements, while operating in a harsh environment. Although functional diagnosis is currently the norm, many occurring faults during lifetime, e.g. due to aging, cannot be diagnosed. This poses serious threats during operation as correction for dependability is not possible in this case. This suggests the introduction of structural diagnosis techniques. Major problem is that a number of different hierarchies have to be considered and reuse of reliability data at different hierarchies should be possible. This paper investigates a new approach for the development of dependable analogue/mixed-signal car front-ends, by interfacing aging models between different hierarchies enabling structural diagnosis, and explicitly using simultaneously design and simulation data as well as built-in observation measurements at all hierarchies.
    Original languageUndefined
    Title of host publication18th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2012
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Number of pages6
    ISBN (Print)978-1-4673-1925-6
    Publication statusPublished - 16 May 2012
    Event18th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2012 - Taipei, Taiwan
    Duration: 14 May 201216 May 2012
    Conference number: 18

    Publication series

    PublisherIEEE Computer Society


    Workshop18th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2012
    Abbreviated titleIMS3TW


    • CAES-TDT: Testable Design and Test
    • Dependability
    • aging models
    • analogue automotive front-ends
    • (Structural) diagnosis
    • hierarchical interfacing
    • EWI-22694
    • METIS-296173
    • IR-83457
    • Reliability

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