Hierarchical test pattern generation

E.C. Weening, Hans G. Kerkhoff, J.M. Steensma

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publication2nd Symposium on design methodology
    Place of PublicationDalfsen
    Pages193-193
    Number of pages1
    Publication statusPublished - 1 Sep 1990

    Keywords

    • METIS-112973

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