Hierarchical test-pattern generation

E.C. Weening, Hans G. Kerkhoff

    Research output: Contribution to conferencePoster

    Original languageEnglish
    Pages-
    Publication statusPublished - 29 Nov 1990
    EventFOM Werkgemeenschap Halfgeleiders 1990 - Veldhoven, Netherlands
    Duration: 28 Nov 199029 Nov 1990

    Conference

    ConferenceFOM Werkgemeenschap Halfgeleiders 1990
    CountryNetherlands
    CityVeldhoven
    Period28/11/9029/11/90

    Keywords

    • METIS-117346

    Cite this

    Weening, E. C., & Kerkhoff, H. G. (1990). Hierarchical test-pattern generation. -. Poster session presented at FOM Werkgemeenschap Halfgeleiders 1990, Veldhoven, Netherlands.
    Weening, E.C. ; Kerkhoff, Hans G. / Hierarchical test-pattern generation. Poster session presented at FOM Werkgemeenschap Halfgeleiders 1990, Veldhoven, Netherlands.
    @conference{020cca0d7bc04be3a099cff75089abca,
    title = "Hierarchical test-pattern generation",
    keywords = "METIS-117346",
    author = "E.C. Weening and Kerkhoff, {Hans G.}",
    year = "1990",
    month = "11",
    day = "29",
    language = "English",
    pages = "--",
    note = "FOM Werkgemeenschap Halfgeleiders 1990 ; Conference date: 28-11-1990 Through 29-11-1990",

    }

    Weening, EC & Kerkhoff, HG 1990, 'Hierarchical test-pattern generation' FOM Werkgemeenschap Halfgeleiders 1990, Veldhoven, Netherlands, 28/11/90 - 29/11/90, pp. -.

    Hierarchical test-pattern generation. / Weening, E.C.; Kerkhoff, Hans G.

    1990. - Poster session presented at FOM Werkgemeenschap Halfgeleiders 1990, Veldhoven, Netherlands.

    Research output: Contribution to conferencePoster

    TY - CONF

    T1 - Hierarchical test-pattern generation

    AU - Weening, E.C.

    AU - Kerkhoff, Hans G.

    PY - 1990/11/29

    Y1 - 1990/11/29

    KW - METIS-117346

    M3 - Poster

    SP - -

    ER -

    Weening EC, Kerkhoff HG. Hierarchical test-pattern generation. 1990. Poster session presented at FOM Werkgemeenschap Halfgeleiders 1990, Veldhoven, Netherlands.