Hierarchical test-pattern generation

E.C. Weening, Hans G. Kerkhoff

    Research output: Contribution to conferencePoster

    Original languageEnglish
    Pages-
    Publication statusPublished - 29 Nov 1990
    EventFOM Werkgemeenschap Halfgeleiders 1990 - Veldhoven, Netherlands
    Duration: 28 Nov 199029 Nov 1990

    Conference

    ConferenceFOM Werkgemeenschap Halfgeleiders 1990
    CountryNetherlands
    CityVeldhoven
    Period28/11/9029/11/90

    Keywords

    • METIS-117346

    Cite this

    Weening, E. C., & Kerkhoff, H. G. (1990). Hierarchical test-pattern generation. -. Poster session presented at FOM Werkgemeenschap Halfgeleiders 1990, Veldhoven, Netherlands.