High accuracy spatial mapping of the tunneling decay length

A. Saedi, R. de Vries, Arie van Houselt, D. Kockmann, Bene Poelsema, Henricus J.W. Zandvliet

Research output: Contribution to conferencePoster

Original languageUndefined
Pages-
Publication statusPublished - 16 Nov 2007
EventDutch Scanning Probe Microscopy Day 2007 - University of Leiden, Leiden, Netherlands
Duration: 16 Nov 200716 Nov 2007

Conference

ConferenceDutch Scanning Probe Microscopy Day 2007
Abbreviated titleDutch SPM Day 2007
CountryNetherlands
CityLeiden
Period16/11/0716/11/07

Keywords

  • METIS-245243

Cite this

Saedi, A., de Vries, R., van Houselt, A., Kockmann, D., Poelsema, B., & Zandvliet, H. J. W. (2007). High accuracy spatial mapping of the tunneling decay length. -. Poster session presented at Dutch Scanning Probe Microscopy Day 2007, Leiden, Netherlands.