High energy ion beam analysis on polymers at cryogenic temperatures

M. P. De Jong; L. J. Van Ijzendoorn; M. J.A. De Voigt

doi:10.1016/S0168-583X(99)00886-1

High energy ion beam analysis on polymers at cryogenic temperatures

M. P. De Jong, L. J. Van Ijzendoorn, M. J.A. De Voigt

Research output: Contribution to journal › Conference article › Academic › peer-review

10 Citations (Scopus)

Abstract

We recently constructed a high energy ion scattering (HEIS) setup in which samples can be cooled to cryogenic temperatures to suppress ion beam induced damage in polymers. A closed cycle helium gas cooler provides the cooling power of 2 W at 10 K. The setup is equipped with a sample mount that enables sample exchange via a load lock system, while ensuring a good thermal contact with the sample holder by a shrink coupling. We investigated the effects of sample cooling on HEIS measurements on model polymer light emitting diodes and polyacrylate films. It can be concluded that hydrogen loss can be decreased from 50% to 10% for the same irradiation dose, and much more accurate depth profiling of elements is possible.

Original language	English
Pages (from-to)	207-210
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	161-163
DOIs	https://doi.org/10.1016/S0168-583X(99)00886-1
Publication status	Published - Mar 2000
Externally published	Yes
Event	14th International Conference on Ion Beam Analysis and 6th European Conference on Accelerators in Applied Research and Technology 1999 - Dresden, Germany Duration: 26 Jul 1999 → 30 Jul 1999

Keywords

n/a OA procedure

Access to Document

10.1016/S0168-583X(99)00886-1

Cite this

@article{f90a2618d9f64caf93bf2a26a3a8e192,

title = "High energy ion beam analysis on polymers at cryogenic temperatures",

abstract = "We recently constructed a high energy ion scattering (HEIS) setup in which samples can be cooled to cryogenic temperatures to suppress ion beam induced damage in polymers. A closed cycle helium gas cooler provides the cooling power of 2 W at 10 K. The setup is equipped with a sample mount that enables sample exchange via a load lock system, while ensuring a good thermal contact with the sample holder by a shrink coupling. We investigated the effects of sample cooling on HEIS measurements on model polymer light emitting diodes and polyacrylate films. It can be concluded that hydrogen loss can be decreased from 50% to 10% for the same irradiation dose, and much more accurate depth profiling of elements is possible.",

keywords = "n/a OA procedure",

author = "{De Jong}, {M. P.} and {Van Ijzendoorn}, {L. J.} and {De Voigt}, {M. J.A.}",

year = "2000",

month = mar,

doi = "10.1016/S0168-583X(99)00886-1",

language = "English",

volume = "161-163",

pages = "207--210",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier B.V.",

note = "14th International Conference on Ion Beam Analysis and 6th European Conference on Accelerators in Applied Research and Technology 1999, IBA 1999 ; Conference date: 26-07-1999 Through 30-07-1999",

}

TY - JOUR

T1 - High energy ion beam analysis on polymers at cryogenic temperatures

AU - De Jong, M. P.

AU - Van Ijzendoorn, L. J.

AU - De Voigt, M. J.A.

PY - 2000/3

Y1 - 2000/3

N2 - We recently constructed a high energy ion scattering (HEIS) setup in which samples can be cooled to cryogenic temperatures to suppress ion beam induced damage in polymers. A closed cycle helium gas cooler provides the cooling power of 2 W at 10 K. The setup is equipped with a sample mount that enables sample exchange via a load lock system, while ensuring a good thermal contact with the sample holder by a shrink coupling. We investigated the effects of sample cooling on HEIS measurements on model polymer light emitting diodes and polyacrylate films. It can be concluded that hydrogen loss can be decreased from 50% to 10% for the same irradiation dose, and much more accurate depth profiling of elements is possible.

AB - We recently constructed a high energy ion scattering (HEIS) setup in which samples can be cooled to cryogenic temperatures to suppress ion beam induced damage in polymers. A closed cycle helium gas cooler provides the cooling power of 2 W at 10 K. The setup is equipped with a sample mount that enables sample exchange via a load lock system, while ensuring a good thermal contact with the sample holder by a shrink coupling. We investigated the effects of sample cooling on HEIS measurements on model polymer light emitting diodes and polyacrylate films. It can be concluded that hydrogen loss can be decreased from 50% to 10% for the same irradiation dose, and much more accurate depth profiling of elements is possible.

KW - n/a OA procedure

UR - http://www.scopus.com/inward/record.url?scp=0033871283&partnerID=8YFLogxK

U2 - 10.1016/S0168-583X(99)00886-1

DO - 10.1016/S0168-583X(99)00886-1

M3 - Conference article

AN - SCOPUS:0033871283

SN - 0168-583X

VL - 161-163

SP - 207

EP - 210

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

T2 - 14th International Conference on Ion Beam Analysis and 6th European Conference on Accelerators in Applied Research and Technology 1999

Y2 - 26 July 1999 through 30 July 1999

ER -

High energy ion beam analysis on polymers at cryogenic temperatures

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this