High-energy neutrons characterization of a safety critical computing system

A. Fedi; M. Ottavi; G. Furano; A. Bruno; R. Senesi; C. Andreani; C. Cazzaniga

doi:10.1109/DFT.2017.8244456

High-energy neutrons characterization of a safety critical computing system

A. Fedi, M. Ottavi, G. Furano, A. Bruno, R. Senesi, C. Andreani, C. Cazzaniga

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

Abstract

This article presents use of a neutron beam for error injection in safety-critical Commercial Off-the-Shelf (COTS) based platform GeminiX implemented on System on Chip (SoC) FPGA (Field Programmable Gate Array). The results represent an important indication of the resilience of the safety critical system showing a full coverage of soft errors caused by atmospheric neutrons.

Original language	English
Title of host publication	2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
DOIs	https://doi.org/10.1109/DFT.2017.8244456
Publication status	Published - 2017
Externally published	Yes
Event	IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017 - Cambridge, United Kingdom Duration: 23 Oct 2017 → 25 Oct 2017

Conference

Conference	IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
Abbreviated title	DFT 2017
Country/Territory	United Kingdom
City	Cambridge
Period	23/10/17 → 25/10/17

Access to Document

10.1109/DFT.2017.8244456

Cite this

@inproceedings{10a8c0734c194a7696dd05a52b4baa40,

title = "High-energy neutrons characterization of a safety critical computing system",

abstract = "This article presents use of a neutron beam for error injection in safety-critical Commercial Off-the-Shelf (COTS) based platform GeminiX implemented on System on Chip (SoC) FPGA (Field Programmable Gate Array). The results represent an important indication of the resilience of the safety critical system showing a full coverage of soft errors caused by atmospheric neutrons.",

author = "A. Fedi and M. Ottavi and G. Furano and A. Bruno and R. Senesi and C. Andreani and C. Cazzaniga",

year = "2017",

doi = "10.1109/DFT.2017.8244456",

language = "English",

booktitle = "2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017",

note = "IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, DFT 2017 ; Conference date: 23-10-2017 Through 25-10-2017",

}

Fedi, A, Ottavi, M, Furano, G, Bruno, A, Senesi, R, Andreani, C & Cazzaniga, C 2017, High-energy neutrons characterization of a safety critical computing system. in 2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, 23/10/17. https://doi.org/10.1109/DFT.2017.8244456

TY - GEN

T1 - High-energy neutrons characterization of a safety critical computing system

AU - Fedi, A.

AU - Ottavi, M.

AU - Furano, G.

AU - Bruno, A.

AU - Senesi, R.

AU - Andreani, C.

AU - Cazzaniga, C.

PY - 2017

Y1 - 2017

N2 - This article presents use of a neutron beam for error injection in safety-critical Commercial Off-the-Shelf (COTS) based platform GeminiX implemented on System on Chip (SoC) FPGA (Field Programmable Gate Array). The results represent an important indication of the resilience of the safety critical system showing a full coverage of soft errors caused by atmospheric neutrons.

AB - This article presents use of a neutron beam for error injection in safety-critical Commercial Off-the-Shelf (COTS) based platform GeminiX implemented on System on Chip (SoC) FPGA (Field Programmable Gate Array). The results represent an important indication of the resilience of the safety critical system showing a full coverage of soft errors caused by atmospheric neutrons.

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-85046032674&partnerID=MN8TOARS

U2 - 10.1109/DFT.2017.8244456

DO - 10.1109/DFT.2017.8244456

M3 - Conference contribution

BT - 2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017

T2 - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017

Y2 - 23 October 2017 through 25 October 2017

ER -

High-energy neutrons characterization of a safety critical computing system

Abstract

Conference

Access to Document

Other files and links

Fingerprint

Cite this