High-Performance Deep Submicron MOSTs With Polycrystalline-(Si,Ge) Gates

Y.V. Ponomarev, C. Salm, Jurriaan Schmitz, P.H. Woerlee, D.J. Gravesteijn

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    7 Citations (Scopus)
    55 Downloads (Pure)
    Original languageEnglish
    Title of host publicationVLSI TSA
    Place of PublicationTaiwan
    Number of pages5
    Publication statusPublished - 6 Jun 1997


    • METIS-113865

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