High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies

C. Bolchini, A. Miele, C. Sandionigi, M. Ottavi, S. Pontarelli, A. Salsano, C. Metra, M. Omaña, D. Rossi, M.S. Reorda, L. Sterpone, M. Violante, S. Gerardin, M. Bagatin, A. Paccagnella

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review