High resolution magnetic force microscopy using focused ion beam modified tips

G.N. Phillips, M.H. Siekman, L. Abelmann, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    69 Citations (Scopus)

    Abstract

    Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an extremely high aspect ratio of greater than 30:1, and an end radius of less than 25 nm. These tips have been used in a commercial atomic force microscope under ambient conditions to obtain 30 nm resolution magnetic images of an established CoNi/Pt multilayer reference sample.
    Original languageEnglish
    Pages (from-to)865-867
    Number of pages3
    JournalApplied physics letters
    Volume81
    Issue number5
    DOIs
    Publication statusPublished - 2002

    Keywords

    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • Magnetic viscosity
    • Magnetization reversal
    • Magneto-optic recording media
    • Multilayers
    • SMI-TST: From 2006 in EWI-TST
    • TST-MFM: Magnetic Force Microscope
    • TST-uSPAM: micro Scanning Probe Array Memory
    • TSTNE-Probe-MFM: Magnetic Force Microscope

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