High resolution magnetic force microscopy using focused ion beam modified tips

G.N. Phillips, Martin Herman Siekman, Leon Abelmann, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    67 Citations (Scopus)

    Abstract

    Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an extremely high aspect ratio of greater than 30:1, and an end radius of less than 25 nm. These tips have been used in a commercial atomic force microscope under ambient conditions to obtain 30 nm resolution magnetic images of an established CoNi/Pt multilayer reference sample.
    Original languageUndefined
    Article number10.1063/1.1497434
    Pages (from-to)865-867
    Number of pages3
    JournalApplied physics letters
    Volume81
    Issue number5
    DOIs
    Publication statusPublished - 2002

    Keywords

    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • Magnetic viscosity
    • Magnetization reversal
    • Magneto-optic recording media
    • Multilayers
    • IR-63025
    • SMI-TST: From 2006 in EWI-TST
    • TST-MFM: Magnetic Force Microscope
    • TST-uSPAM: micro Scanning Probe Array Memory
    • TSTNE-Probe-MFM: Magnetic Force Microscope
    • METIS-208691
    • EWI-5613

    Cite this

    @article{32aacc86ab4146a1a810313626db8c3c,
    title = "High resolution magnetic force microscopy using focused ion beam modified tips",
    abstract = "Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an extremely high aspect ratio of greater than 30:1, and an end radius of less than 25 nm. These tips have been used in a commercial atomic force microscope under ambient conditions to obtain 30 nm resolution magnetic images of an established CoNi/Pt multilayer reference sample.",
    keywords = "SMI-EXP: EXPERIMENTAL TECHNIQUES, Magnetic viscosity, Magnetization reversal, Magneto-optic recording media, Multilayers, IR-63025, SMI-TST: From 2006 in EWI-TST, TST-MFM: Magnetic Force Microscope, TST-uSPAM: micro Scanning Probe Array Memory, TSTNE-Probe-MFM: Magnetic Force Microscope, METIS-208691, EWI-5613",
    author = "G.N. Phillips and Siekman, {Martin Herman} and Leon Abelmann and J.C. Lodder",
    note = "Imported from SMI Reference manager",
    year = "2002",
    doi = "10.1063/1.1497434",
    language = "Undefined",
    volume = "81",
    pages = "865--867",
    journal = "Applied physics letters",
    issn = "0003-6951",
    publisher = "American Institute of Physics",
    number = "5",

    }

    High resolution magnetic force microscopy using focused ion beam modified tips. / Phillips, G.N.; Siekman, Martin Herman; Abelmann, Leon; Lodder, J.C.

    In: Applied physics letters, Vol. 81, No. 5, 10.1063/1.1497434, 2002, p. 865-867.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - High resolution magnetic force microscopy using focused ion beam modified tips

    AU - Phillips, G.N.

    AU - Siekman, Martin Herman

    AU - Abelmann, Leon

    AU - Lodder, J.C.

    N1 - Imported from SMI Reference manager

    PY - 2002

    Y1 - 2002

    N2 - Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an extremely high aspect ratio of greater than 30:1, and an end radius of less than 25 nm. These tips have been used in a commercial atomic force microscope under ambient conditions to obtain 30 nm resolution magnetic images of an established CoNi/Pt multilayer reference sample.

    AB - Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an extremely high aspect ratio of greater than 30:1, and an end radius of less than 25 nm. These tips have been used in a commercial atomic force microscope under ambient conditions to obtain 30 nm resolution magnetic images of an established CoNi/Pt multilayer reference sample.

    KW - SMI-EXP: EXPERIMENTAL TECHNIQUES

    KW - Magnetic viscosity

    KW - Magnetization reversal

    KW - Magneto-optic recording media

    KW - Multilayers

    KW - IR-63025

    KW - SMI-TST: From 2006 in EWI-TST

    KW - TST-MFM: Magnetic Force Microscope

    KW - TST-uSPAM: micro Scanning Probe Array Memory

    KW - TSTNE-Probe-MFM: Magnetic Force Microscope

    KW - METIS-208691

    KW - EWI-5613

    U2 - 10.1063/1.1497434

    DO - 10.1063/1.1497434

    M3 - Article

    VL - 81

    SP - 865

    EP - 867

    JO - Applied physics letters

    JF - Applied physics letters

    SN - 0003-6951

    IS - 5

    M1 - 10.1063/1.1497434

    ER -