High resolution magnetic force microscopy using focussed ion beam modified tips

G.N. Phillips, Martin Herman Siekman, Leon Abelmann, J.C. Lodder

    Research output: Contribution to conferencePaper

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    Abstract

    Summary form only given. Magnetic force microscopy (MFM) is well established for imaging surface magnetic stray fields. With commercial microscopes and magnetic tips, images with 50 nm resolution are quite routine; however, obtaining higher resolutions is experimentally more demanding. Higher resolution is required for imaging patterned magnetic elements and the latest magnetic media where bit lengths are less than 40 nm. Sub-30 nm resolution images of a 20 bilayer Co/sub 50/Ni/sub 50//Pt thin film have been obtained using Si tips coated with Co and modified by focused ion beam (FIB) milling. Imaging was performed at room temperature, in air, with a Digital Instruments D13100 MFM in tapping/lift mode.
    Original languageUndefined
    DOIs
    Publication statusPublished - 2002
    Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - RAI Congress Center, Amsterdam, Netherlands
    Duration: 28 Apr 20022 May 2002

    Conference

    Conference2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
    Abbreviated titleINTERMAG Europe 2002
    CountryNetherlands
    CityAmsterdam
    Period28/04/022/05/02

    Keywords

    • IR-55897

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