Abstract
We present the development of a probe for scanning probe microscopy and recording, called the CantiClever. This probe is designed to address the issue of the less than ideal tip geometry of conventional MFM tips and to allow the integration of other sensors other than an MFM tip with relative ease. Simulations of the influence of the tip‐end shape on the tip’s transfer function indicate that an ellipsoidal shape results in the highest possible resolution because of the absence of zero‐signal frequencies in the tip’s spatial frequency response. Furthermore, the magnetic domain structure of the tip was investigated with the use of MFM. It was determined that the tip, once magnetized, consists of one single magnetic domain. To exploit the capability for sensor integration, a magneto resistive element was integrated on the probe. This type of probe can be used in scanning probe microscopy and recording.
Original language | English |
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Title of host publication | Scanning Tunneling Microscopy/Spectroscopy and Related Techniques |
Subtitle of host publication | 12th International Conference STM'03 |
Editors | Paul M. Koenraad, Martijn Kemerink |
Place of Publication | New York, NY |
Publisher | American Institute of Physics |
Pages | 320-328 |
Number of pages | 8 |
ISBN (Print) | 0-7354-0168-3 |
DOIs | |
Publication status | Published - 20 Jul 2003 |
Event | 12th International Conference on Scanning Tunneling Microscopy, STM 2003 - Eindhoven, Netherlands Duration: 20 Jul 2003 → 25 Jul 2003 Conference number: 12 |
Publication series
Name | AIP Conference Proceedings |
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Publisher | AIP |
Volume | 696 |
Conference
Conference | 12th International Conference on Scanning Tunneling Microscopy, STM 2003 |
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Abbreviated title | STM |
Country | Netherlands |
City | Eindhoven |
Period | 20/07/03 → 25/07/03 |