High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy

A.G. van den Bos, A.J. le Fèbre, H. Saito, K. Ramstöck, M.H. Siekman, L. Abelmann, J.C. Lodder

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Abstract

    We present the development of a probe for scanning probe microscopy and recording, called the CantiClever. This probe is designed to address the issue of the less than ideal tip geometry of conventional MFM tips and to allow the integration of other sensors other than an MFM tip with relative ease. Simulations of the influence of the tip‐end shape on the tip’s transfer function indicate that an ellipsoidal shape results in the highest possible resolution because of the absence of zero‐signal frequencies in the tip’s spatial frequency response. Furthermore, the magnetic domain structure of the tip was investigated with the use of MFM. It was determined that the tip, once magnetized, consists of one single magnetic domain. To exploit the capability for sensor integration, a magneto resistive element was integrated on the probe. This type of probe can be used in scanning probe microscopy and recording.
    Original languageEnglish
    Title of host publicationScanning Tunneling Microscopy/Spectroscopy and Related Techniques
    Subtitle of host publication12th International Conference STM'03
    EditorsPaul M. Koenraad, Martijn Kemerink
    Place of PublicationNew York, NY
    PublisherAmerican Institute of Physics
    Pages320-328
    Number of pages8
    ISBN (Print)0-7354-0168-3
    DOIs
    Publication statusPublished - 20 Jul 2003
    Event12th International Conference on Scanning Tunneling Microscopy, STM 2003 - Eindhoven, Netherlands
    Duration: 20 Jul 200325 Jul 2003
    Conference number: 12

    Publication series

    NameAIP Conference Proceedings
    PublisherAIP
    Volume696

    Conference

    Conference12th International Conference on Scanning Tunneling Microscopy, STM 2003
    Abbreviated titleSTM
    CountryNetherlands
    CityEindhoven
    Period20/07/0325/07/03

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