High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy

A.G. van den Bos; A.J. le Fèbre; H. Saito; K. Ramstöck; M.H. Siekman; L. Abelmann; J.C. Lodder

doi:10.1063/1.1639713

High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy

A.G. van den Bos, A.J. le Fèbre, H. Saito, K. Ramstöck, M.H. Siekman, L. Abelmann, J.C. Lodder

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

We present the development of a probe for scanning probe microscopy and recording, called the CantiClever. This probe is designed to address the issue of the less than ideal tip geometry of conventional MFM tips and to allow the integration of other sensors other than an MFM tip with relative ease. Simulations of the influence of the tip‐end shape on the tip’s transfer function indicate that an ellipsoidal shape results in the highest possible resolution because of the absence of zero‐signal frequencies in the tip’s spatial frequency response. Furthermore, the magnetic domain structure of the tip was investigated with the use of MFM. It was determined that the tip, once magnetized, consists of one single magnetic domain. To exploit the capability for sensor integration, a magneto resistive element was integrated on the probe. This type of probe can be used in scanning probe microscopy and recording.

Original language	English
Title of host publication	Scanning Tunneling Microscopy/Spectroscopy and Related Techniques
Subtitle of host publication	12th International Conference STM'03
Editors	Paul M. Koenraad, Martijn Kemerink
Place of Publication	New York, NY
Publisher	American Institute of Physics
Pages	320-328
Number of pages	8
ISBN (Print)	0-7354-0168-3
DOIs	https://doi.org/10.1063/1.1639713
Publication status	Published - 20 Jul 2003
Event	12th International Conference on Scanning Tunneling Microscopy, STM 2003 - Eindhoven, Netherlands Duration: 20 Jul 2003 → 25 Jul 2003 Conference number: 12

Publication series

Name	AIP Conference Proceedings
Publisher	AIP
Volume	696

Conference

Conference	12th International Conference on Scanning Tunneling Microscopy, STM 2003
Abbreviated title	STM
Country/Territory	Netherlands
City	Eindhoven
Period	20/07/03 → 25/07/03

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10.1063/1.1639713

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van den Bos, A. G., le Fèbre, A. J., Saito, H., Ramstöck, K., Siekman, M. H., Abelmann, L., & Lodder, J. C. (2003). High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy. In P. M. Koenraad, & M. Kemerink (Eds.), Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference STM'03 (pp. 320-328). (AIP Conference Proceedings; Vol. 696). American Institute of Physics. https://doi.org/10.1063/1.1639713

van den Bos, A.G. ; le Fèbre, A.J. ; Saito, H. ; Ramstöck, K. ; Siekman, M.H. ; Abelmann, L. ; Lodder, J.C. / High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy. Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference STM'03. editor / Paul M. Koenraad ; Martijn Kemerink. New York, NY : American Institute of Physics, 2003. pp. 320-328 (AIP Conference Proceedings).

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title = "High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy",

abstract = "We present the development of a probe for scanning probe microscopy and recording, called the CantiClever. This probe is designed to address the issue of the less than ideal tip geometry of conventional MFM tips and to allow the integration of other sensors other than an MFM tip with relative ease. Simulations of the influence of the tip‐end shape on the tip{\textquoteright}s transfer function indicate that an ellipsoidal shape results in the highest possible resolution because of the absence of zero‐signal frequencies in the tip{\textquoteright}s spatial frequency response. Furthermore, the magnetic domain structure of the tip was investigated with the use of MFM. It was determined that the tip, once magnetized, consists of one single magnetic domain. To exploit the capability for sensor integration, a magneto resistive element was integrated on the probe. This type of probe can be used in scanning probe microscopy and recording.",

author = "{van den Bos}, A.G. and {le F{\`e}bre}, A.J. and H. Saito and K. Ramst{\"o}ck and M.H. Siekman and L. Abelmann and J.C. Lodder",

year = "2003",

month = jul,

day = "20",

doi = "10.1063/1.1639713",

language = "English",

isbn = "0-7354-0168-3",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics",

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booktitle = "Scanning Tunneling Microscopy/Spectroscopy and Related Techniques",

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van den Bos, AG, le Fèbre, AJ, Saito, H, Ramstöck, K, Siekman, MH , Abelmann, L & Lodder, JC 2003, High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy. in PM Koenraad & M Kemerink (eds), Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference STM'03. AIP Conference Proceedings, vol. 696, American Institute of Physics, New York, NY, pp. 320-328, 12th International Conference on Scanning Tunneling Microscopy, STM 2003, Eindhoven, Netherlands, 20/07/03. https://doi.org/10.1063/1.1639713

High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy. / van den Bos, A.G.; le Fèbre, A.J.; Saito, H.; Ramstöck, K.; Siekman, M.H.; Abelmann, L.; Lodder, J.C.

Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference STM'03. ed. / Paul M. Koenraad; Martijn Kemerink. New York, NY : American Institute of Physics, 2003. p. 320-328 (AIP Conference Proceedings; Vol. 696).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy

AU - van den Bos, A.G.

AU - le Fèbre, A.J.

AU - Saito, H.

AU - Ramstöck, K.

AU - Siekman, M.H.

AU - Abelmann, L.

AU - Lodder, J.C.

N1 - Conference code: 12

PY - 2003/7/20

Y1 - 2003/7/20

N2 - We present the development of a probe for scanning probe microscopy and recording, called the CantiClever. This probe is designed to address the issue of the less than ideal tip geometry of conventional MFM tips and to allow the integration of other sensors other than an MFM tip with relative ease. Simulations of the influence of the tip‐end shape on the tip’s transfer function indicate that an ellipsoidal shape results in the highest possible resolution because of the absence of zero‐signal frequencies in the tip’s spatial frequency response. Furthermore, the magnetic domain structure of the tip was investigated with the use of MFM. It was determined that the tip, once magnetized, consists of one single magnetic domain. To exploit the capability for sensor integration, a magneto resistive element was integrated on the probe. This type of probe can be used in scanning probe microscopy and recording.

AB - We present the development of a probe for scanning probe microscopy and recording, called the CantiClever. This probe is designed to address the issue of the less than ideal tip geometry of conventional MFM tips and to allow the integration of other sensors other than an MFM tip with relative ease. Simulations of the influence of the tip‐end shape on the tip’s transfer function indicate that an ellipsoidal shape results in the highest possible resolution because of the absence of zero‐signal frequencies in the tip’s spatial frequency response. Furthermore, the magnetic domain structure of the tip was investigated with the use of MFM. It was determined that the tip, once magnetized, consists of one single magnetic domain. To exploit the capability for sensor integration, a magneto resistive element was integrated on the probe. This type of probe can be used in scanning probe microscopy and recording.

U2 - 10.1063/1.1639713

DO - 10.1063/1.1639713

M3 - Conference contribution

SN - 0-7354-0168-3

T3 - AIP Conference Proceedings

SP - 320

EP - 328

BT - Scanning Tunneling Microscopy/Spectroscopy and Related Techniques

A2 - Koenraad, Paul M.

A2 - Kemerink, Martijn

PB - American Institute of Physics

CY - New York, NY

T2 - 12th International Conference on Scanning Tunneling Microscopy, STM 2003

Y2 - 20 July 2003 through 25 July 2003

ER -

van den Bos AG, le Fèbre AJ, Saito H, Ramstöck K, Siekman MH , Abelmann L et al. High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy. In Koenraad PM, Kemerink M, editors, Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference STM'03. New York, NY: American Institute of Physics. 2003. p. 320-328. (AIP Conference Proceedings). https://doi.org/10.1063/1.1639713

High resolution magnetic tips and integrated multi-wire probes for scanning probe microscopy

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