High resolution MFM: simulation of tip sharpening

H. Saito, A.G. van den Bos, Leon Abelmann, J.C. Lodder

    Research output: Contribution to conferencePaperAcademic

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    Abstract

    In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.
    Original languageUndefined
    DOIs
    Publication statusPublished - 2003
    EventIEEE International Magnetics Conference, INTERMAG 2003 - Boston, United States
    Duration: 30 Mar 20033 Apr 2003

    Conference

    ConferenceIEEE International Magnetics Conference, INTERMAG 2003
    Abbreviated titleINTERMAG 2003
    CountryUnited States
    CityBoston
    Period30/03/033/04/03

    Keywords

    • IR-55851

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