High-resolution MFM: simulation of tip sharpening

Hitoshi Saito, A.G. van den Bos, Leon Abelmann, J.C. Lodder

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    Abstract

    The transfer functions of tips with various sharpened tip ends were calculated and the resolution of these tips was esti-mated by considering the resolution limit due to thermal noise at room temperature. The tip having an ellipsoidal tip end (ellipsoidal tip) is found to be a suitable candidate for high-resolution magnetic force microscopy. Sharpening of the flat tip end makes zero signal frequencies disappear for tips with ellipticities larger than tan 45 . The sensitivity shows a maximum around an ellipticity of tan 80 . The ellipsoidal tip shows a much smaller tip thickness dependence compared to the tip having a flat tip end because only the tip end mainly contributes to signals in case of the ellipsoidal tip.
    Original languageUndefined
    Pages (from-to)3447-3449
    Number of pages3
    JournalIEEE transactions on magnetics
    Volume39
    Issue number5
    DOIs
    Publication statusPublished - 2003

    Keywords

    • Simulation
    • Resolution
    • magnetic tips
    • EWI-5632
    • TST-MFM: Magnetic Force Microscope
    • Magnetic force microscopy (MFM)
    • SMI-TST: From 2006 in EWI-TST
    • SMI-EXP: EXPERIMENTAL TECHNIQUES
    • METIS-212078
    • IR-45378
    • TST-uSPAM: micro Scanning Probe Array Memory

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