High resolution MFM: simulation of tip sharpening

H. Saito; A.G. van den Bos; Leon Abelmann; J.C. Lodder

doi:10.1109/INTMAG.2003.1230602

High resolution MFM: simulation of tip sharpening

H. Saito
, A.G. van den Bos
, Leon Abelmann
, J.C. Lodder

Research output: Contribution to conference › Paper

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Abstract

In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.

Original language	Undefined
DOIs	https://doi.org/10.1109/INTMAG.2003.1230602
Publication status	Published - 2003
Event	IEEE International Magnetics Conference, INTERMAG 2003 - Boston, United States Duration: 30 Mar 2003 → 3 Apr 2003

Conference

Conference	IEEE International Magnetics Conference, INTERMAG 2003
Abbreviated title	INTERMAG 2003
Country/Territory	United States
City	Boston
Period	30/03/03 → 3/04/03

Keywords

IR-55851

Access to Document

10.1109/INTMAG.2003.1230602

01230602

Cite this

@conference{069834252c3f41bc80a42631850ffedc,

title = "High resolution MFM: simulation of tip sharpening",

abstract = "In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.",

keywords = "IR-55851",

author = "H. Saito and \{van den Bos\}, A.G. and Leon Abelmann and J.C. Lodder",

year = "2003",

doi = "10.1109/INTMAG.2003.1230602",

language = "Undefined",

note = "IEEE International Magnetics Conference, INTERMAG 2003 ; Conference date: 30-03-2003 Through 03-04-2003",

}

TY - CONF

T1 - High resolution MFM: simulation of tip sharpening

AU - Saito, H.

AU - van den Bos, A.G.

AU - Abelmann, Leon

AU - Lodder, J.C.

PY - 2003

Y1 - 2003

N2 - In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.

AB - In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution.

KW - IR-55851

U2 - 10.1109/INTMAG.2003.1230602

DO - 10.1109/INTMAG.2003.1230602

M3 - Paper

T2 - IEEE International Magnetics Conference, INTERMAG 2003

Y2 - 30 March 2003 through 3 April 2003

ER -