High throughout screening method and apparatus for analyzing interactions between surfaces with different topography and environment

Jan de Boer (Inventor), Clemens van Blitterswijk (Inventor), H.V. Unadkat (Inventor), Dimitrios Stamatialis (Inventor), B.J. Papenburg (Inventor), Matthias Wessling (Inventor)

Research output: Patent

Original languageEnglish
Patent numberWO 2009/058015 A1
Publication statusIn preparation - 2009

Keywords

  • METIS-318347

Cite this

de Boer, J., van Blitterswijk, C., Unadkat, H. V., Stamatialis, D., Papenburg, B. J., & Wessling, M. (2009). High throughout screening method and apparatus for analyzing interactions between surfaces with different topography and environment. Manuscript in preparation. (Patent No. WO 2009/058015 A1).