|Patent number||WO 2009/058015 A1|
|Publication status||In preparation - 2009|
de Boer, J., van Blitterswijk, C., Unadkat, H. V., Stamatialis, D., Papenburg, B. J., & Wessling, M. (2009). High throughout screening method and apparatus for analyzing interactions between surfaces with different topography and environment. Manuscript in preparation. (Patent No. WO 2009/058015 A1).