High throughout screening method and apparatus for analyzing interactions between surfaces with different topography and environment

Jan de Boer; Clemens van Blitterswijk; H.V. Unadkat; Dimitrios Stamatialis; B.J. Papenburg; Matthias Wessling

High throughout screening method and apparatus for analyzing interactions between surfaces with different topography and environment

Jan de Boer (Inventor), Clemens van Blitterswijk (Inventor), H.V. Unadkat (Inventor), Dimitrios Stamatialis (Inventor), B.J. Papenburg (Inventor), Matthias Wessling (Inventor)

Research output: Patent

Original language	English
Patent number	WO 2009/058015 A1
Publication status	In preparation - 2009

Keywords

METIS-318347

Cite this

@misc{b4009a418345400fa9c8500e475d93b0,

title = "High throughout screening method and apparatus for analyzing interactions between surfaces with different topography and environment",

keywords = "METIS-318347",

author = "{de Boer}, Jan and {van Blitterswijk}, Clemens and H.V. Unadkat and Dimitrios Stamatialis and B.J. Papenburg and Matthias Wessling",

year = "2009",

language = "English",

type = "Patent",

note = "WO 2009/058015 A1",

}