HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT

Jan de Boer; Clemens van Blitterswijk; H.V. Unadkat; Dimitrios Stamatialis,; B.J. Papenburg; Matthias Wessling,

HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT

Jan de Boer (Inventor), Clemens van Blitterswijk (Inventor), H.V. Unadkat (Inventor), Dimitrios Stamatialis, (Inventor), B.J. Papenburg (Inventor), Matthias Wessling, (Inventor)

Research output: Patent

Abstract

The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

Original language	English
Patent number	WO2009058015
IPC	G01N 33/ 543 A I
Priority date	2/11/07
Publication status	Published - 7 May 2009

Cite this

@misc{15e49cbbc83d424b9d4eab236353b6c9,

title = "HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT",

abstract = "The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.",

author = "{de Boer}, Jan and {van Blitterswijk}, Clemens and H.V. Unadkat and Dimitrios Stamatialis, and B.J. Papenburg and Matthias Wessling,",

year = "2009",

month = may,

day = "7",

language = "English",

type = "Patent",

note = "WO2009058015; G01N 33/ 543 A I",

}

TY - PAT

T1 - HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT

AU - de Boer, Jan

AU - van Blitterswijk, Clemens

AU - Unadkat, H.V.

AU - Stamatialis,, Dimitrios

AU - Papenburg, B.J.

AU - Wessling,, Matthias

PY - 2009/5/7

Y1 - 2009/5/7

N2 - The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

AB - The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

M3 - Patent

M1 - WO2009058015

ER -

HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT

Abstract

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