HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT

Jan de Boer (Inventor), Clemens van Blitterswijk (Inventor), H.V. Unadkat (Inventor), Dimitrios Stamatialis, (Inventor), B.J. Papenburg (Inventor), Matthias Wessling, (Inventor)

Research output: PatentProfessional

Abstract

The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

Original languageEnglish
Patent numberWO2009058015
IPCG01N 33/ 543 A I
Priority date2/11/07
Publication statusPublished - 7 May 2009

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Cite this

de Boer, J., van Blitterswijk, C., Unadkat, H. V., Stamatialis, D., Papenburg, B. J., & Wessling, M. (2009). IPC No. G01N 33/ 543 A I. HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT. (Patent No. WO2009058015).
de Boer, Jan (Inventor) ; van Blitterswijk, Clemens (Inventor) ; Unadkat, H.V. (Inventor) ; Stamatialis, Dimitrios (Inventor) ; Papenburg, B.J. (Inventor) ; Wessling, Matthias (Inventor). / HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT. IPC No.: G01N 33/ 543 A I. Patent No.: WO2009058015.
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abstract = "The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.",
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de Boer, J, van Blitterswijk, C, Unadkat, HV, Stamatialis, D, Papenburg, BJ & Wessling, M 2009, HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT, Patent No. WO2009058015, IPC No. G01N 33/ 543 A I.

HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT. / de Boer, Jan (Inventor); van Blitterswijk, Clemens (Inventor); Unadkat, H.V. (Inventor); Stamatialis, Dimitrios (Inventor); Papenburg, B.J. (Inventor); Wessling, Matthias (Inventor).

IPC No.: G01N 33/ 543 A I. Patent No.: WO2009058015.

Research output: PatentProfessional

TY - PAT

T1 - HIGH THROUGHPUT SCREENING METHOD AND APPARATUS FOR ANALYSING INTERACTIONS BETWEEN SURFACES WITH DIFFERENT TOPOGRAPHY AND THE ENVIRONMENT

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AU - van Blitterswijk, Clemens

AU - Unadkat, H.V.

AU - Stamatialis,, Dimitrios

AU - Papenburg, B.J.

AU - Wessling,, Matthias

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AB - The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

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