Abstract
The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.
Original language | English |
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Patent number | CN101952720 |
IPC | G01N 33/ 543 A I |
Priority date | 31/10/08 |
Publication status | Published - 19 Jan 2011 |