High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment

Jan de Boer (Inventor), Clemens van Blitterswijk (Inventor), Hemant Vijaykumar Unadkat (Inventor), Dimitrios Stamatialis (Inventor), Berendien Jacoba Papenburg (Inventor), Matthias Wessling (Inventor)

Research output: Patent

Abstract

The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

Original languageEnglish
Patent numberCN101952720
IPCG01N 33/ 543 A I
Priority date31/10/08
Publication statusPublished - 19 Jan 2011

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