High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment

Jan de Boer; Clemens van Blitterswijk; Hemant Vijaykumar Unadkat; Dimitrios Stamatialis; Berendien Jacoba Papenburg; Matthias Wessling

High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment

Jan de Boer (Inventor)
, Clemens van Blitterswijk (Inventor)
, Hemant Vijaykumar Unadkat (Inventor)
, Dimitrios Stamatialis (Inventor)
, Berendien Jacoba Papenburg (Inventor)
, Matthias Wessling (Inventor)

Research output: Patent

Abstract

The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

Original language	English
Patent number	CN101952720
IPC	G01N 33/ 543 A I
Priority date	31/10/08
Publication status	Published - 19 Jan 2011

Cite this

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title = "High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment",

abstract = "The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.",

author = "\{de Boer\}, Jan and \{van Blitterswijk\}, Clemens and Unadkat, \{Hemant Vijaykumar\} and Dimitrios Stamatialis and Papenburg, \{Berendien Jacoba\} and Matthias Wessling",

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day = "19",

language = "English",

type = "Patent",

note = "CN101952720; G01N 33/ 543 A I",

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T1 - High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment

AU - de Boer, Jan

AU - van Blitterswijk, Clemens

AU - Unadkat, Hemant Vijaykumar

AU - Stamatialis, Dimitrios

AU - Papenburg, Berendien Jacoba

AU - Wessling, Matthias

PY - 2011/1/19

Y1 - 2011/1/19

N2 - The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

AB - The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.

M3 - Patent

M1 - CN101952720

ER -

High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment

Abstract

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