High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment

H.V. Unadkat; Antoni Van Blitterswijk Clemens; D. Stamatialis; Jan de Boer; B.J. Papenburg; M. Wessling

High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment

H.V. Unadkat (Inventor), Antoni Van Blitterswijk Clemens (Inventor), D. Stamatialis (Inventor), Jan de Boer (Inventor), B.J. Papenburg (Inventor), M. Wessling (Inventor)

Research output: Patent

Original language	English
Patent number	AU2008319579
IPC	G01N 33/ 543 A I
Priority date	31/10/08
Publication status	Published - 7 May 2009

Cite this

@misc{ba02fd4b9d6d46368cb5059ff09e16b1,

title = "High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment",

author = "H.V. Unadkat and Clemens, {Antoni Van Blitterswijk} and D. Stamatialis and {de Boer}, Jan and B.J. Papenburg and M. Wessling",

year = "2009",

month = may,

day = "7",

language = "English",

type = "Patent",

note = "AU2008319579; G01N 33/ 543 A I",

}