High throughput screening method and apparatus for analysing interactions between surfaces with different topography and the environment

H.V. Unadkat (Inventor), Antoni Van Blitterswijk Clemens (Inventor), D. Stamatialis (Inventor), Jan de Boer (Inventor), B.J. Papenburg (Inventor), M. Wessling (Inventor)

Research output: Patent

Original languageEnglish
Patent numberAU2008319579
IPCG01N 33/ 543 A I
Priority date31/10/08
Publication statusPublished - 7 May 2009

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