Abstract
Focused ion beam etching has been used to pattern dc SQUIDs into previously characterised template bi-epitaxial grain boundary junctions. In this way, the screening parameter βL can be optimised for a chosen temperature (in our case 30 K). Electrical characteristics, including noise measurements, are presented. A minimal white noise level of 22 μφ0·Hz12 (1.8·10-29 J·Hz-1) has been obtained at 20 K. Using bias current modulation the 1/f noise could be almost completely suppressed down to 1 Hz in the entire temperature range (10–65 K).
Original language | English |
---|---|
Pages (from-to) | 3353-3354 |
Number of pages | 2 |
Journal | Physica C |
Volume | 235-240 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1994 |