Abstract
A passive integrated optical waveguiderefractometer based on bendloss changes in a spiral-shaped channel waveguide is proposed and fabricated in Si3N4/SiO2 technology. The experimentally determined performance and the theoretical predictions, based on a simple model for so-called “whispering gallery modes,” agree very well. The minimum detectable refractive index change was measured to be Δn=1.3×10−5.
Original language | Undefined |
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Pages (from-to) | 2895-2897 |
Journal | Applied physics letters |
Volume | 71 |
Issue number | 20 |
DOIs | |
Publication status | Published - 1997 |
Keywords
- METIS-111542
- IR-98127