Hole-doping of mechanically exfoliated graphene by confined hydration layers

Tjeerd R.J. Bollmann*, Liubov Yu Antipina, Matthias Temmen, Michael Reichling, Pavel B. Sorokin

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

20 Citations (Scopus)
8 Downloads (Pure)

Abstract

By the use of non-contact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM), we measure the local surface potential of mechanically exfoliated graphene on the prototypical insulating hydrophilic substrate of CaF2(111). Hydration layers confined between the graphene and the CaF2 substrate, resulting from the graphene’s preparation under ambient conditions on the hydrophilic substrate surface, are found to electronically modify the graphene as the material’s electron density transfers from graphene to the hydration layer. Density functional theory (DFT) calculations predict that the first 2 to 3 water layers adjacent to the graphene hole-dope the graphene by several percent of a unit charge per unit cell. [Figure not available: see fulltext.]

Original languageEnglish
Pages (from-to)3020-3026
Number of pages7
JournalNano research
Volume8
Issue number9
DOIs
Publication statusPublished - 15 Sept 2015

Keywords

  • Electronic transport in nanoscale materials and structures
  • Graphene
  • Liquid-solid interface structure
  • Non-contact atomic force microscopy (NC-AFM, KPFM)
  • n/a OA procedure

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