Hot-carrier degradation in DMOS power devices

M.A.R.C. de Wolf, A.J. Mouthaan, A. Pergoot

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the ProRISC Workshop on Circuits, Systems and Signal Proceeding 1997
Place of Publication	Mierlo, The Netherlands
Pages	689-692
Number of pages	4
Publication status	Published - 27 Nov 1997

Keywords

@inproceedings{9b159d0c29b847928af1b4f10d02e3dd,

title = "Hot-carrier degradation in DMOS power devices",

keywords = "METIS-113854",

author = "{de Wolf}, M.A.R.C. and A.J. Mouthaan and A. Pergoot",

year = "1997",

month = nov,

day = "27",

language = "Undefined",

isbn = "90-73461-12-X",

pages = "689--692",

booktitle = "Proceedings of the ProRISC Workshop on Circuits, Systems and Signal Proceeding 1997",

}