Hot-carrier degradation in DMOS power devices

M.A.R.C. de Wolf, A.J. Mouthaan, A. Pergoot

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the ProRISC Workshop on Circuits, Systems and Signal Proceeding 1997
    Place of PublicationMierlo, The Netherlands
    Pages689-692
    Number of pages4
    Publication statusPublished - 27 Nov 1997

    Keywords

    • METIS-113854

    Cite this

    de Wolf, M. A. R. C., Mouthaan, A. J., & Pergoot, A. (1997). Hot-carrier degradation in DMOS power devices. In Proceedings of the ProRISC Workshop on Circuits, Systems and Signal Proceeding 1997 (pp. 689-692). Mierlo, The Netherlands.