Hot-carrier degradation in DMOS power devices

M.A.R.C. de Wolf, A.J. Mouthaan, A. Pergoot

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the ProRISC Workshop on Circuits, Systems and Signal Proceeding 1997
    Place of PublicationMierlo, The Netherlands
    Number of pages4
    Publication statusPublished - 27 Nov 1997


    • METIS-113854

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