Hot-carrier degradation in DMOS power devices

M.A.R.C. de Wolf, A.J. Mouthaan, Hans Wallinga

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationDish Hotel, Enschede
    Publication statusPublished - 11 Jun 1997

    Keywords

    • METIS-114918

    Cite this