Hot-carrier degradation modeling and simulation of DMOS devices

M.A.R.C. de Wolf

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationDish Hotel Enschede
    Publication statusPublished - 11 Jun 1997

    Keywords

    • METIS-114902

    Cite this

    de Wolf, M. A. R. C. (1997, Jun 11). Hot-carrier degradation modeling and simulation of DMOS devices. Dish Hotel Enschede.