How to Solve the Main Reliability Problem in Future IC Devices: Modeling the Stress and Electromigration

M. Dekker, V. Petrescu, M. Rijnsburger, Cora Salm, A.J. Mouthaan

Research output: Other contribution › Other research output

Keywords

@misc{00db6dcbf564482bbc7c7bb0e94b4051,

title = "How to Solve the Main Reliability Problem in Future IC Devices: Modeling the Stress and Electromigration",

keywords = "METIS-114891",

author = "M. Dekker and V. Petrescu and M. Rijnsburger and Cora Salm and A.J. Mouthaan",

year = "1998",

month = jun,

day = "23",

language = "Undefined",

type = "Other",

}