Hydrogen diffusion measurements using Y thin film monitoring

Olena Soroka, J.M. Sturm (Contributor), Christopher James Lee (Contributor), F. Bijkerk (Contributor)

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - Jan 2018
EventPhysics@Veldhoven 2018 - NH Conference Center Koningshof, Velhoven, Netherlands
Duration: 23 Jan 201824 Jan 2019
https://www.nwo-i.nl/agenda/agenda/physicsveldhoven-2018/

Conference

ConferencePhysics@Veldhoven 2018
CountryNetherlands
CityVelhoven
Period23/01/1824/01/19
Internet address

Cite this

Soroka, O., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2018). Hydrogen diffusion measurements using Y thin film monitoring. Poster session presented at Physics@Veldhoven 2018, Velhoven, Netherlands.