Hydrogenation dynamics of Ru capped y thin films

O. Soroka; J.M. Sturm; R.W.E. van de Kruijs; I.A. Makhotkin; K. Nikolaev; S.N. Yakunin; C.J. Lee; F. Bijkerk

doi:10.1063/1.5094592

Hydrogenation dynamics of Ru capped y thin films

O. Soroka^*, J.M. Sturm, R.W.E. van de Kruijs, I.A. Makhotkin, K. Nikolaev, S.N. Yakunin, C.J. Lee, F. Bijkerk

^*Corresponding author for this work

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Abstract

The structural changes in Ru-coated Y films during hydrogenation were studied in this work. In situ XRD data were used to show that the Y to YH₂ transition requires significant hydrogen loading of the Y lattice. By comparing the XRD data with the in situ spectroscopic ellipsometry data, an effective medium model for the transition was obtained. This model describes the Y to YH₂ transition well. The YH₂ to YH₃ transition is also described by an effective medium model, however, with reduced accuracy around the midpoint of the transition. By comparing the YH₂ and YH₃ crystal sizes, we show that these deviations may be due to a surface plasmon resonance. The improved understanding of the ellipsometry measurements is important for optical hydrogen sensing applications.

Original language	English
Article number	145301
Journal	Journal of Applied Physics
Volume	126
Issue number	14
DOIs	https://doi.org/10.1063/1.5094592
Publication status	Published - 8 Oct 2019

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title = "Hydrogenation dynamics of Ru capped y thin films",

abstract = "The structural changes in Ru-coated Y films during hydrogenation were studied in this work. In situ XRD data were used to show that the Y to YH2 transition requires significant hydrogen loading of the Y lattice. By comparing the XRD data with the in situ spectroscopic ellipsometry data, an effective medium model for the transition was obtained. This model describes the Y to YH2 transition well. The YH2 to YH3 transition is also described by an effective medium model, however, with reduced accuracy around the midpoint of the transition. By comparing the YH2 and YH3 crystal sizes, we show that these deviations may be due to a surface plasmon resonance. The improved understanding of the ellipsometry measurements is important for optical hydrogen sensing applications.",

author = "O. Soroka and J.M. Sturm and {van de Kruijs}, R.W.E. and I.A. Makhotkin and K. Nikolaev and S.N. Yakunin and C.J. Lee and F. Bijkerk",

year = "2019",

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doi = "10.1063/1.5094592",

language = "English",

volume = "126",

journal = "Journal of Applied Physics",

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TY - JOUR

T1 - Hydrogenation dynamics of Ru capped y thin films

AU - Soroka, O.

AU - Sturm, J.M.

AU - van de Kruijs, R.W.E.

AU - Makhotkin, I.A.

AU - Nikolaev, K.

AU - Yakunin, S.N.

AU - Lee, C.J.

AU - Bijkerk, F.

PY - 2019/10/8

Y1 - 2019/10/8

N2 - The structural changes in Ru-coated Y films during hydrogenation were studied in this work. In situ XRD data were used to show that the Y to YH2 transition requires significant hydrogen loading of the Y lattice. By comparing the XRD data with the in situ spectroscopic ellipsometry data, an effective medium model for the transition was obtained. This model describes the Y to YH2 transition well. The YH2 to YH3 transition is also described by an effective medium model, however, with reduced accuracy around the midpoint of the transition. By comparing the YH2 and YH3 crystal sizes, we show that these deviations may be due to a surface plasmon resonance. The improved understanding of the ellipsometry measurements is important for optical hydrogen sensing applications.

AB - The structural changes in Ru-coated Y films during hydrogenation were studied in this work. In situ XRD data were used to show that the Y to YH2 transition requires significant hydrogen loading of the Y lattice. By comparing the XRD data with the in situ spectroscopic ellipsometry data, an effective medium model for the transition was obtained. This model describes the Y to YH2 transition well. The YH2 to YH3 transition is also described by an effective medium model, however, with reduced accuracy around the midpoint of the transition. By comparing the YH2 and YH3 crystal sizes, we show that these deviations may be due to a surface plasmon resonance. The improved understanding of the ellipsometry measurements is important for optical hydrogen sensing applications.

U2 - 10.1063/1.5094592

DO - 10.1063/1.5094592

M3 - Article

AN - SCOPUS:85073213264

SN - 0021-8979

VL - 126

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 14

M1 - 145301

ER -

Hydrogenation dynamics of Ru capped y thin films

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