Hydrogenation dynamics of Ru capped y thin films

O. Soroka, J. M. Sturm, R. W.E. Van De Kruijs, I. A. Makhotkin, K. Nikolaev, S. N. Yakunin, C. J. Lee, F. Bijkerk

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

The structural changes in Ru-coated Y films during hydrogenation were studied in this work. In situ XRD data were used to show that the Y to YH2 transition requires significant hydrogen loading of the Y lattice. By comparing the XRD data with the in situ spectroscopic ellipsometry data, an effective medium model for the transition was obtained. This model describes the Y to YH2 transition well. The YH2 to YH3 transition is also described by an effective medium model, however, with reduced accuracy around the midpoint of the transition. By comparing the YH2 and YH3 crystal sizes, we show that these deviations may be due to a surface plasmon resonance. The improved understanding of the ellipsometry measurements is important for optical hydrogen sensing applications.

Original languageEnglish
Article number145301
JournalJournal of applied physics
Volume126
Issue number14
DOIs
Publication statusPublished - 8 Oct 2019

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hydrogenation
thin films
ellipsometry
hydrogen
surface plasmon resonance
deviation
crystals

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@article{700589c1c1e1431f95d0c9ff915af29a,
title = "Hydrogenation dynamics of Ru capped y thin films",
abstract = "The structural changes in Ru-coated Y films during hydrogenation were studied in this work. In situ XRD data were used to show that the Y to YH2 transition requires significant hydrogen loading of the Y lattice. By comparing the XRD data with the in situ spectroscopic ellipsometry data, an effective medium model for the transition was obtained. This model describes the Y to YH2 transition well. The YH2 to YH3 transition is also described by an effective medium model, however, with reduced accuracy around the midpoint of the transition. By comparing the YH2 and YH3 crystal sizes, we show that these deviations may be due to a surface plasmon resonance. The improved understanding of the ellipsometry measurements is important for optical hydrogen sensing applications.",
author = "O. Soroka and Sturm, {J. M.} and {Van De Kruijs}, {R. W.E.} and Makhotkin, {I. A.} and K. Nikolaev and Yakunin, {S. N.} and Lee, {C. J.} and F. Bijkerk",
year = "2019",
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doi = "10.1063/1.5094592",
language = "English",
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journal = "Journal of applied physics",
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Hydrogenation dynamics of Ru capped y thin films. / Soroka, O.; Sturm, J. M.; Van De Kruijs, R. W.E.; Makhotkin, I. A.; Nikolaev, K.; Yakunin, S. N.; Lee, C. J.; Bijkerk, F.

In: Journal of applied physics, Vol. 126, No. 14, 145301, 08.10.2019.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Hydrogenation dynamics of Ru capped y thin films

AU - Soroka, O.

AU - Sturm, J. M.

AU - Van De Kruijs, R. W.E.

AU - Makhotkin, I. A.

AU - Nikolaev, K.

AU - Yakunin, S. N.

AU - Lee, C. J.

AU - Bijkerk, F.

PY - 2019/10/8

Y1 - 2019/10/8

N2 - The structural changes in Ru-coated Y films during hydrogenation were studied in this work. In situ XRD data were used to show that the Y to YH2 transition requires significant hydrogen loading of the Y lattice. By comparing the XRD data with the in situ spectroscopic ellipsometry data, an effective medium model for the transition was obtained. This model describes the Y to YH2 transition well. The YH2 to YH3 transition is also described by an effective medium model, however, with reduced accuracy around the midpoint of the transition. By comparing the YH2 and YH3 crystal sizes, we show that these deviations may be due to a surface plasmon resonance. The improved understanding of the ellipsometry measurements is important for optical hydrogen sensing applications.

AB - The structural changes in Ru-coated Y films during hydrogenation were studied in this work. In situ XRD data were used to show that the Y to YH2 transition requires significant hydrogen loading of the Y lattice. By comparing the XRD data with the in situ spectroscopic ellipsometry data, an effective medium model for the transition was obtained. This model describes the Y to YH2 transition well. The YH2 to YH3 transition is also described by an effective medium model, however, with reduced accuracy around the midpoint of the transition. By comparing the YH2 and YH3 crystal sizes, we show that these deviations may be due to a surface plasmon resonance. The improved understanding of the ellipsometry measurements is important for optical hydrogen sensing applications.

U2 - 10.1063/1.5094592

DO - 10.1063/1.5094592

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JO - Journal of applied physics

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SN - 0021-8979

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