IC-level Testability for Analog Macros

V. Kaal, Hans G. Kerkhoff, J.S. Hollema

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of 3rd International Mixed-Signal Testing Workshop
    Place of PublicationSeattle USA
    Pages101-105
    Number of pages5
    Publication statusPublished - 1 Jun 1997

    Keywords

    • METIS-112941

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