Skip to main navigation Skip to search Skip to main content

IC-level Testability for Analog Macros

  • V. Kaal
  • , J.S. Hollema
  • , Hans G. Kerkhoff

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationDish Hotel Enschede The Netherlands
    Publication statusPublished - 11 Jun 1997

    Keywords

    • METIS-114816

    Cite this