IC-level Testability for Analog Macros

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of 3rd International Mixed-Signal Testing Workshop
Place of Publication	Seattle USA
Pages	101-105
Number of pages	5
Publication status	Published - 1 Jun 1997

Keywords

@inproceedings{59591de2ac424702a88319f408a08529,

title = "IC-level Testability for Analog Macros",

keywords = "METIS-112941",

author = "V. Kaal and Kerkhoff, \{Hans G.\} and J.S. Hollema",

year = "1997",

month = jun,

day = "1",

language = "Undefined",

pages = "101--105",

booktitle = "Proceedings of 3rd International Mixed-Signal Testing Workshop",

}