Identification of thermal and electrical time constants in SOI MOSFETS from small signal measurements

B.M. Tenbroek, W. Redman-White, M.J. Uren, M.S.L. Lee, M.C.L. Ward

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of the 23rd European Solid State Device Research Conference, ESSDERC '93
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages189-192
ISBN (Print)2-86332-135-8
Publication statusPublished - 1 Jun 1993
Externally publishedYes
Event23rd European Solid State Device Research Conference, ESSDERC 1993 - Grenoble, France
Duration: 13 Sep 199316 Sep 1993
Conference number: 23

Conference

Conference23rd European Solid State Device Research Conference, ESSDERC 1993
Abbreviated titleESSDERC
CountryFrance
CityGrenoble
Period13/09/9316/09/93

Cite this

Tenbroek, B. M., Redman-White, W., Uren, M. J., Lee, M. S. L., & Ward, M. C. L. (1993). Identification of thermal and electrical time constants in SOI MOSFETS from small signal measurements. In Proceedings of the 23rd European Solid State Device Research Conference, ESSDERC '93 (pp. 189-192). Piscataway, NJ: IEEE.