Identifying failure mechanisms in LDMOS transistors by analytical stability analysis

A. Ferrara, P.G. Steeneken, B.K. Boksteen, A. Heringa, A.J. Scholten, Jurriaan Schmitz, Raymond Josephus Engelbart Hueting

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    2 Citations (Scopus)
    31 Downloads (Pure)

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