IJTAG compatible analogue embedded instruments for MPSoC life-time prediction

Jerrin Pathrose Vareed, Ghazanfar Ali, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

Decreasing reliability of nanometer CMOS technologies with each technology generation is a bottleneck for development of dependable Cyber Physical Systems. This paper presents two analogue health monitors, namely IDDT and temperature along with their integration to the IJTAG network for MPSoC life-time prediction. The monitors are integrated as embedded instruments in a MPSoC. A technique for dynamic synthesis of the analogue front-end for the IDDT instrument and an architecture for integrating analogue embedded instruments into an IJTAG network is introduced in this paper. The embedded instruments have been designed in TSMC 40nm CMOS technology.
Original languageEnglish
Title of host publication2018 IEEE 19th Latin-American Test Symposium (LATS)
Pages1-4
Number of pages4
ISBN (Electronic)978-1-5386-1472-3
DOIs
Publication statusPublished - 26 Apr 2018
Event19th IEEE Latin-American Test Symposium 2018 - Sao Paulo, Brazil
Duration: 12 Mar 201816 Mar 2018
Conference number: 19
http://www.politecnica.pucrs.br/~sisc/LATS2018/

Conference

Conference19th IEEE Latin-American Test Symposium 2018
Abbreviated titleLATS 2018
CountryBrazil
CitySao Paulo
Period12/03/1816/03/18
Internet address

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Health
Temperature
Cyber Physical System

Cite this

Pathrose Vareed, Jerrin ; Ali, Ghazanfar ; Kerkhoff, Hans G. / IJTAG compatible analogue embedded instruments for MPSoC life-time prediction. 2018 IEEE 19th Latin-American Test Symposium (LATS). 2018. pp. 1-4
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Pathrose Vareed, J, Ali, G & Kerkhoff, HG 2018, IJTAG compatible analogue embedded instruments for MPSoC life-time prediction. in 2018 IEEE 19th Latin-American Test Symposium (LATS). pp. 1-4, 19th IEEE Latin-American Test Symposium 2018, Sao Paulo, Brazil, 12/03/18. https://doi.org/10.1109/LATW.2018.8349691

IJTAG compatible analogue embedded instruments for MPSoC life-time prediction. / Pathrose Vareed, Jerrin ; Ali, Ghazanfar ; Kerkhoff, Hans G.

2018 IEEE 19th Latin-American Test Symposium (LATS). 2018. p. 1-4.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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