Abstract
Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.
Original language | Undefined |
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Title of host publication | 9th International Design & Test Symposium, IDT 2014 |
Place of Publication | USA |
Publisher | IEEE Computer Society |
Pages | 18-23 |
Number of pages | 6 |
ISBN (Print) | 978-1-4799-8200-4 |
DOIs | |
Publication status | Published - 28 Nov 2014 |
Event | 9th International Design & Test Symposium, IDT 2014 - Algiers, Algeria Duration: 16 Dec 2014 → 18 Dec 2014 Conference number: 9 |
Publication series
Name | |
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Publisher | IEEE Computer Society |
Conference
Conference | 9th International Design & Test Symposium, IDT 2014 |
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Abbreviated title | IDT |
Country | Algeria |
City | Algiers |
Period | 16/12/14 → 18/12/14 |
Keywords
- EWI-25382
- METIS-309700
- IR-94492