iJTAG integration of complex digital embedded instruments

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    9 Citations (Scopus)
    1 Downloads (Pure)

    Abstract

    Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.
    Original languageUndefined
    Title of host publication9th International Design & Test Symposium, IDT 2014
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages18-23
    Number of pages6
    ISBN (Print)978-1-4799-8200-4
    DOIs
    Publication statusPublished - 28 Nov 2014
    Event9th International Design & Test Symposium, IDT 2014 - Algiers, Algeria
    Duration: 16 Dec 201418 Dec 2014
    Conference number: 9

    Publication series

    Name
    PublisherIEEE Computer Society

    Conference

    Conference9th International Design & Test Symposium, IDT 2014
    Abbreviated titleIDT
    CountryAlgeria
    CityAlgiers
    Period16/12/1418/12/14

    Keywords

    • EWI-25382
    • METIS-309700
    • IR-94492

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