iJTAG integration of complex digital embedded instruments

Ahmed Mohammed Youssef Ibrahim; Hans G. Kerkhoff

doi:10.1109/IDT.2014.7038580

iJTAG integration of complex digital embedded instruments

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

11 Citations (Scopus)

18 Downloads (Pure)

Abstract

Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.

Original language	Undefined
Title of host publication	9th International Design & Test Symposium, IDT 2014
Place of Publication	USA
Publisher	IEEE
Pages	18-23
Number of pages	6
ISBN (Print)	978-1-4799-8200-4
DOIs	https://doi.org/10.1109/IDT.2014.7038580
Publication status	Published - 28 Nov 2014
Event	9th International Design & Test Symposium, IDT 2014 - Algiers, Algeria Duration: 16 Dec 2014 → 18 Dec 2014 Conference number: 9

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	9th International Design & Test Symposium, IDT 2014
Abbreviated title	IDT
Country/Territory	Algeria
City	Algiers
Period	16/12/14 → 18/12/14

Keywords

EWI-25382
METIS-309700
IR-94492

Access to Document

10.1109/IDT.2014.7038580

http://eprints.eemcs.utwente.nl/secure2/25382/01/iJTAG_Integration_of_Complex_Digital_Embedded_Instruments.pdf

Cite this

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title = "iJTAG integration of complex digital embedded instruments",

abstract = "Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.",

keywords = "EWI-25382, METIS-309700, IR-94492",

author = "Ibrahim, \{Ahmed Mohammed Youssef\} and Kerkhoff, \{Hans G.\}",

note = "eemcs-eprint-25382 ; 9th International Design \& Test Symposium, IDT 2014 ; Conference date: 16-12-2014 Through 18-12-2014",

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day = "28",

doi = "10.1109/IDT.2014.7038580",

language = "Undefined",

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publisher = "IEEE",

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AU - Kerkhoff, Hans G.

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N2 - Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.

AB - Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.

KW - EWI-25382

KW - METIS-309700

KW - IR-94492

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M3 - Conference contribution

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BT - 9th International Design & Test Symposium, IDT 2014

PB - IEEE

CY - USA

T2 - 9th International Design & Test Symposium, IDT 2014

Y2 - 16 December 2014 through 18 December 2014

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