Imaging and identification of solf assembled monolayers using Helium Ion Microscopy

G. Hlawacek, A. George, Johan E. ten Elshof, Raoul van Gastel, Henricus J.W. Zandvliet, Bene Poelsema

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Pages-
Publication statusPublished - 1 Nov 2011
Event58th AVS International Symposium & Exhibition 2011 - Nashville, United States
Duration: 30 Oct 20114 Nov 2011
Conference number: 58
http://www2.avs.org/symposium/avs58/pages/greetings.html

Conference

Conference58th AVS International Symposium & Exhibition 2011
Country/TerritoryUnited States
CityNashville
Period30/10/114/11/11
Internet address

Keywords

  • METIS-281080

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