Component models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). A method to extract these models using measurements on integrated circuits (ICs) already exists. This measurement method for ICs with single-ended connections is extended, to include ICs with differential connections. The LM2902 op-amp is measured and modeled as a first case study.
|Publisher||Oficyna Wydawnicza Politechniki Wroclawskiej|
|Conference||9th Symposium on EMC and 20th International Wroclaw Symposium on Electromagnetic Compatibility|
|Period||13/09/10 → 17/09/10|
- EC Grant Agreement nr.: FP7/205294
- EC Grant Agreement nr.: FP7/2007-2013