Impact of layout and technology variation on the CDM performance of ggNMOSTs and SCRs

M.S.B. Sowariraj, F.G. Kuper, Cora Salm, A.J. Mouthaan, T Smedes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of 5th Annual Workshop on Semiconductors Advances for Future Electronics SAFE 2002
Place of Publication	Utrecht, The Netherlands
Publisher	STW
Pages	104-107
Number of pages	4
ISBN (Print)	90-73461-33-2
Publication status	Published - 27 Nov 2002

Keywords

@inproceedings{e724da1be8224b32b9349511a54631b0,

title = "Impact of layout and technology variation on the CDM performance of ggNMOSTs and SCRs",

keywords = "METIS-207342",

author = "M.S.B. Sowariraj and F.G. Kuper and Cora Salm and A.J. Mouthaan and T Smedes",

year = "2002",

month = nov,

day = "27",

language = "Undefined",

isbn = "90-73461-33-2",

pages = "104--107",

booktitle = "Proceedings of 5th Annual Workshop on Semiconductors Advances for Future Electronics SAFE 2002",

publisher = "STW",

}

Proceedings of 5th Annual Workshop on Semiconductors Advances for Future Electronics SAFE 2002. Utrecht, The Netherlands : STW, 2002. p. 104-107.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Impact of layout and technology variation on the CDM performance of ggNMOSTs and SCRs

AU - Sowariraj, M.S.B.

AU - Kuper, F.G.

AU - Salm, Cora

AU - Mouthaan, A.J.

AU - Smedes, T

PY - 2002/11/27

Y1 - 2002/11/27

KW - METIS-207342

M3 - Conference contribution

SN - 90-73461-33-2

SP - 104

EP - 107

BT - Proceedings of 5th Annual Workshop on Semiconductors Advances for Future Electronics SAFE 2002

PB - STW

CY - Utrecht, The Netherlands

ER -