Implementing 0.1 nm B4C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance

Dennis IJpes*, Andrey Yakshin, J.M. Sturm, Marcelo Ackermann

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
40 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Implementing 0.1 nm B4C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance'. Together they form a unique fingerprint.

Chemistry

Material Science

Engineering

Neuroscience