Improved arrayed-waveguide-grating layout avoiding systematic phase errors

Nur Ismail; Fei Sun; Gabriel Sengo; Kerstin Wörhoff; Alfred Driessen; René M. de Ridder; Markus Pollnau

doi:10.1364/OE.19.008781

Improved arrayed-waveguide-grating layout avoiding systematic phase errors

Nur Ismail, Fei Sun, Gabriel Sengo, Kerstin Wörhoff, Alfred Driessen, René M. de Ridder, Markus Pollnau

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Abstract

We present a detailed description of an improved arrayed-waveguide-grating (AWG) layout for both, low and high diffraction orders. The novel layout presents identical bends across the entire array; in this way systematic phase errors arising from different bends that are inherent to conventional AWG designs are completely eliminated. In addition, for high-order AWGs our design results in more than 50% reduction of the occupied area on the wafer. We present an experimental characterization of a low-order device fabricated according to this geometry. The device has a resolution of 5.5 nm, low intrinsic losses (< 2 dB) in the wavelength region of interest for the application, and is polarization insensitive over a wide spectral range of 215 nm.

Original language	English
Pages (from-to)	8781-8794
Number of pages	14
Journal	Optics express
Volume	19
Issue number	9
DOIs	https://doi.org/10.1364/OE.19.008781
Publication status	Published - 20 Apr 2011

Keywords

IOMS-PIT: PHOTONICS INTEGRATION TECHNOLOGY
Wavelength filtering devices
Spectrometers
Arrayed waveguide gratings
AWG

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10.1364/OE.19.008781Licence: CC BY

Ismail2011improvedFinal published version, 1.85 MBLicence: CC BY

Cite this

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title = "Improved arrayed-waveguide-grating layout avoiding systematic phase errors",

abstract = "We present a detailed description of an improved arrayed-waveguide-grating (AWG) layout for both, low and high diffraction orders. The novel layout presents identical bends across the entire array; in this way systematic phase errors arising from different bends that are inherent to conventional AWG designs are completely eliminated. In addition, for high-order AWGs our design results in more than 50% reduction of the occupied area on the wafer. We present an experimental characterization of a low-order device fabricated according to this geometry. The device has a resolution of 5.5 nm, low intrinsic losses (< 2 dB) in the wavelength region of interest for the application, and is polarization insensitive over a wide spectral range of 215 nm.",

keywords = "IOMS-PIT: PHOTONICS INTEGRATION TECHNOLOGY, Wavelength filtering devices, Spectrometers, Arrayed waveguide gratings, AWG",

author = "Nur Ismail and Fei Sun and Gabriel Sengo and Kerstin W{\"o}rhoff and Alfred Driessen and {de Ridder}, {Ren{\'e} M.} and Markus Pollnau",

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doi = "10.1364/OE.19.008781",

language = "English",

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T1 - Improved arrayed-waveguide-grating layout avoiding systematic phase errors

AU - Ismail, Nur

AU - Sun, Fei

AU - Sengo, Gabriel

AU - Wörhoff, Kerstin

AU - Driessen, Alfred

AU - de Ridder, René M.

AU - Pollnau, Markus

PY - 2011/4/20

Y1 - 2011/4/20

N2 - We present a detailed description of an improved arrayed-waveguide-grating (AWG) layout for both, low and high diffraction orders. The novel layout presents identical bends across the entire array; in this way systematic phase errors arising from different bends that are inherent to conventional AWG designs are completely eliminated. In addition, for high-order AWGs our design results in more than 50% reduction of the occupied area on the wafer. We present an experimental characterization of a low-order device fabricated according to this geometry. The device has a resolution of 5.5 nm, low intrinsic losses (< 2 dB) in the wavelength region of interest for the application, and is polarization insensitive over a wide spectral range of 215 nm.

AB - We present a detailed description of an improved arrayed-waveguide-grating (AWG) layout for both, low and high diffraction orders. The novel layout presents identical bends across the entire array; in this way systematic phase errors arising from different bends that are inherent to conventional AWG designs are completely eliminated. In addition, for high-order AWGs our design results in more than 50% reduction of the occupied area on the wafer. We present an experimental characterization of a low-order device fabricated according to this geometry. The device has a resolution of 5.5 nm, low intrinsic losses (< 2 dB) in the wavelength region of interest for the application, and is polarization insensitive over a wide spectral range of 215 nm.

KW - IOMS-PIT: PHOTONICS INTEGRATION TECHNOLOGY

KW - Wavelength filtering devices

KW - Spectrometers

KW - Arrayed waveguide gratings

KW - AWG

U2 - 10.1364/OE.19.008781

DO - 10.1364/OE.19.008781

M3 - Article

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EP - 8794

JO - Optics express

JF - Optics express

IS - 9

ER -

Improved arrayed-waveguide-grating layout avoiding systematic phase errors

Abstract

Keywords

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