Improved binomial charts for monitoring high-quality processes

Willem/Wim Albers

    Research output: Book/ReportReportProfessional

    19 Downloads (Pure)

    Abstract

    For processes concerning attribute data with (very) small failure rate p, often negative binomial control charts are used. The decision whether to stop or continue is made each time r failures have occurred, for some r≥1. Finding the optimal r for detecting a given increase of p first requires alignment of the charts in terms of in-control behavior. In the present paper binomial charts are subjected to this same requirement. Subsequent study reveals that the resulting charts are quite attractive in several aspects, such as detection power. For the case of unknown p, an estimated version of the chart is derived and studied.
    Original languageUndefined
    Place of PublicationEnschede
    PublisherStatistics and Probability (SP)
    Number of pages9
    Publication statusPublished - Oct 2009

    Publication series

    NameMemorandum
    PublisherDepartment of Applied Mathematics, University of Twente
    No.1905
    ISSN (Print)1874-4850
    ISSN (Electronic)1874-4850

    Keywords

    • METIS-264086
    • IR-68222
    • Average run length
    • Geometric charts
    • Health care monitoring
    • Estimated parameters
    • Statistical Process Control
    • EWI-16204
    • MSC-62P10

    Cite this

    Albers, WW. (2009). Improved binomial charts for monitoring high-quality processes. (Memorandum; No. 1905). Enschede: Statistics and Probability (SP).