@inproceedings{162504aad411475aa8c238e74e8a2031,
title = "Improving the Detection of Hardware Trojan Horses in Microprocessors via Hamming Codes",
abstract = "Software-exploitable Hardware Trojan Horses (HTHs) can be inserted into commercial microprocessors allowing the attackers to run their own software or to gain unauthorized privileges. As a consequence, HTHs should nowadays be considered a serious threat not only by the academy but also by the industry. In this paper we present a hardware security checker for the detection of the runtime activation of HTHs. In particular, we aim at detecting HTHs that alter the expected execution flow by launching a malicious program. To achieve this goal the proposed checker is connected between the microprocessor and the main memory and observes the fetching activity. We integrated the proposed checker within a case study based on a RISC-V microprocessor running a set of software benchmarks. The experiment demonstrated that our checker is able to detect 100% of possible HTHs activations with no false alarms. We measured an area overhead of less than 1% w.r.t. LUTs and FFs with 8.5 up to 9.5 BRAM blocks required, a 2.51% power consumption increase, and no working frequency reduction.",
keywords = "Hamming Codes, Hardware Security, Hardware Trojan Horses, Microprocessor-based System, RISC-V, NLA",
author = "Alessandro Palumbo and Luca Cassano and Pedro Reviriego and Marco Ottavi",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, DFT 2023 ; Conference date: 03-10-2023 Through 05-10-2023",
year = "2023",
month = nov,
day = "14",
doi = "10.1109/DFT59622.2023.10313563",
language = "English",
series = "Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT",
publisher = "IEEE",
editor = "Luca Cassano and Mihalis Psarakis and Marcello Traiola and Alberto Bosio",
booktitle = "36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023",
address = "United States",
}