In depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS

Lambertus J. Hanekamp; Albert H.J. van den Berg; Henny J.M. Bouwmeester; Antonius G.B.M. Sasse; Henk Kruidhof

doi:10.1007/BF01244171

In depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS

Lambertus J. Hanekamp, Albert H.J. van den Berg, Henny J.M. Bouwmeester, Antonius G.B.M. Sasse, Henk Kruidhof

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Abstract

The chemical composition of dense ceramics of erbia-stabilized δ-Bi2O3 was analyzed by Auger electron spectroscopy (AES) depth profiling using Ar+ ion sputtering. The relative sensitivity factors (rsf) and sputter rates of bismuth and erbium in this material have been determined by electron probe microanalysis (EPMA) and chemical analysis. These results, supplemented by data from angle resolved X-ray photoelectron spectroscopy (ARXPS), shows a bismuth enrichment at the surface. Evidence has been found for reduction of the bismuth-oxide at the outermost part of the surface layer.

Original language	English
Pages (from-to)	189-194
Number of pages	0
Journal	Microchimica acta
Volume	101
Issue number	1-6
DOIs	https://doi.org/10.1007/BF01244171
Publication status	Published - 1990

Keywords

Ceramic
XPS
Sputtering
AES

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10.1007/BF01244171

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@article{55d1bfeb04ff47b992fe34dbb44b9cac,

title = "In depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS",

abstract = "The chemical composition of dense ceramics of erbia-stabilized δ-Bi2O3 was analyzed by Auger electron spectroscopy (AES) depth profiling using Ar+ ion sputtering. The relative sensitivity factors (rsf) and sputter rates of bismuth and erbium in this material have been determined by electron probe microanalysis (EPMA) and chemical analysis. These results, supplemented by data from angle resolved X-ray photoelectron spectroscopy (ARXPS), shows a bismuth enrichment at the surface. Evidence has been found for reduction of the bismuth-oxide at the outermost part of the surface layer.",

keywords = "Ceramic, XPS, Sputtering, AES",

author = "Hanekamp, {Lambertus J.} and {van den Berg}, {Albert H.J.} and Bouwmeester, {Henny J.M.} and Sasse, {Antonius G.B.M.} and Henk Kruidhof",

year = "1990",

doi = "10.1007/BF01244171",

language = "English",

volume = "101",

pages = "189--194",

journal = "Microchimica acta",

issn = "0026-3672",

publisher = "Springer",

number = "1-6",

}

TY - JOUR

T1 - In depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS

AU - Hanekamp, Lambertus J.

AU - van den Berg, Albert H.J.

AU - Bouwmeester, Henny J.M.

AU - Sasse, Antonius G.B.M.

AU - Kruidhof, Henk

PY - 1990

Y1 - 1990

N2 - The chemical composition of dense ceramics of erbia-stabilized δ-Bi2O3 was analyzed by Auger electron spectroscopy (AES) depth profiling using Ar+ ion sputtering. The relative sensitivity factors (rsf) and sputter rates of bismuth and erbium in this material have been determined by electron probe microanalysis (EPMA) and chemical analysis. These results, supplemented by data from angle resolved X-ray photoelectron spectroscopy (ARXPS), shows a bismuth enrichment at the surface. Evidence has been found for reduction of the bismuth-oxide at the outermost part of the surface layer.

AB - The chemical composition of dense ceramics of erbia-stabilized δ-Bi2O3 was analyzed by Auger electron spectroscopy (AES) depth profiling using Ar+ ion sputtering. The relative sensitivity factors (rsf) and sputter rates of bismuth and erbium in this material have been determined by electron probe microanalysis (EPMA) and chemical analysis. These results, supplemented by data from angle resolved X-ray photoelectron spectroscopy (ARXPS), shows a bismuth enrichment at the surface. Evidence has been found for reduction of the bismuth-oxide at the outermost part of the surface layer.

KW - Ceramic

KW - XPS

KW - Sputtering

KW - AES

U2 - 10.1007/BF01244171

DO - 10.1007/BF01244171

M3 - Article

SN - 0026-3672

VL - 101

SP - 189

EP - 194

JO - Microchimica acta

JF - Microchimica acta

IS - 1-6

ER -

In depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS

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Keywords

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